This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

LM5116: Possible part latch up occurring at customer facility

Part Number: LM5116


We are using the LM5116 in a buck topology to provide a 700mA current source for an an inductive load.  Our VIN is a 70V DC rail and our output voltage is around 30volts with a nominal load.  We have a high side current sense resistor with circuitry to produce the single ended FB signal.  We have built this design and it has been working fine for several years, but recently we have been getting back failed units that have been isolated to the LM5116 (5 to date).  Nothing fails but this part.  The symptom of part failure is that our external VCCX (set at 8.8V)  is being loaded down by excessive current draw from the part.  The current required to bring up VCCX is several hundred mA compared to 6mA typical.  We have noticed that the LO pin to PGND resistance is much lower (around 100 ohms vs 400kohms) than normal.  The high VCCX current only occurs when the part is enabled and is normal when disabled.  Our AGND and PGND plane connections are around a inch from the part which is not optimal.  Our TI rep suspects latch up possibly due to our grounds not being connected together right at the part.  I have been looking at the part to determine what pins may be sensitive to latch up.  The part seems very robust with respect to latchup for AGND and PGND.  I notice that the FB pin can latch up the part and load down the VCCX rail, but this current is there all the time (both on and off) and the LO to PGND resistance is normal.  Question:  What pins if driven below PGND can cause the part to latch up in this manner?  I have tried the LO and VOUT pins in the lab and have not been able to latch up the part with these.  Also, should we be concerned about the plane connection 1 inch away from the part in terms of this failure mechanism described?  We do not have a snubber on the FET outputs like shown in datasheet.  Is this something that can cause negative transients that may cause part to latch up?  Thank you for any insight you may have on this issue.

  • Hello Gary,

    When you speak of higher VCCX currents, is this observed with the so called damaged device, or when testing a good device before it fails?

    The reason why I am curious, is that having an external bias ( VCCX or VCC )can be an issue if External Bias supply is present and Vin is not. The Datasheet discusses the need for a diode on the Vin of the device. I suspect, you are aware of this, but I wanted to verify?

    Regarding VCCX being supplied externally, there could be an issue when driving the FETs during start up? There is a switch over point at around 4.5V? from VCC to VCCX, which could cause the gate drive voltage level to drive the FETs around its linear region.
    Make sure the FETs you are using is OK, being driven at a voltage of ~4.5V during the transition from VCC to VCCX at start up.

    Hope this helps?

    David.
  • Hi David:  The higher VCCX currents were from the damaged parts.  A good part draws only 6mA from VCCX when enabled.  I have verified that VIN is always higher than VCCX during power up and power down in the lab, but I have not been able to get the part to fail in this manner here..   Do you think that if VCCX was higher than VIN for a short time, it could cause the damage I am seeing or just start conducting with no damage?  The driver is typically off during power up so the gate drives are not operating.  The FET's that are being used have RDS-on specified at 10V and we feel comfortable with an 8.8V gate drive when VCCX is up.  We are not seeing FET failure here, just the LM5116.   Do you think we should be using logic level FET's with this part with an 8.8V VCCX?   I am now trying to inject current into the LO pin to try to induce the failure mode we see (high VCCX current when enabled and low resistance between LO and PGND).  Thank you for responding to this.  Any additional comments or thoughts are appreciated. 

    Regards

    Gary

  • Hello Gary,

    Unfortunately beyond discovering that there is damage to the VCC regulator, I am not sure testing a damaged part will yield further insight than what has been currently shown?  Thanks for your information though. 

    Your results suggests VCC is damaged which points to two possibilities.

    1. Over voltage seen at the VCCX

    2. Over current due to some sort of latch up condition.

    1, is very likely caused by VCCX>16V

    2, is very likely caused by Vin<VCCX

    Suggest you rule out 1 and 2 by looking at start up and shut down behavior in the system over full operational conditions.

    Hope this helps?

    David.