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Original question:

About UCD3020

A Problem About UCD3020 and UCD3xxx Device GUI

user5129613
Prodigy 80 points
Other Parts Discussed in Thread: UCD3020, TMS470R1A256

When I used UCD3xxx Device GUI with UCD3020, I encountered a problem.
I want to use memory debugger, but when I clicked the memory debugger after clicking Device ID, a warning window appeared.
The information in the window :
This feature is not available in program (flash) mode on the EVMPSFB00 @ 88d. The device does not support the PARM_INFO and PARM_VALUE commands. These commands are used to peek/poke memory when the IC is in program (flash) mode. Please review your command bitmask or contact TI for asistance.

Can you help me solve this problem?

  • 0
    TI__Mastermind 18370 points

    The issue you are facing is caused by the firmware that you are using.
    The firmware must be very old and it lacks what is needed to support memory debugger.
    What firmware version you are using? Who developed it? Where is it from?

    Your options are:

    1) Use UART for debugging
    2) Convert your project to CCS5 compatible project or up, so you can use JTAG (Firmware modification required).
    3) Add the support needed for Memory debugger (Firmware addition and modification required).

    Option 1) is the easiest option.

  • 0 in reply to Yitzhak Bolurian
    Prodigy 80 points
    Thank you for your answer!
    I choose option 2). But I failed to use XDS100V2 when I convert my project to CCS5 compatible project.
    Can you tell me What type of emulator can I use.
    Thank you!
  • 0 in reply to user5129613
    TI__Mastermind 18370 points

    XDS100V2 is a good choice. What kind of error message you have received? Does it pass the connection test?

  • 0 in reply to Yitzhak Bolurian
    Prodigy 80 points

    Thank you.

    T

    These are my project file properties in CCS3.3.

    When I chose device in CCS6,   TMS470R1A256 was chosen.

    But it can't pass the connection test.

    Is my XDS100V2 damaged?

    Do I choose the wrong device?

    Thank you.

  • 0 in reply to Yitzhak Bolurian
    Prodigy 80 points
    This is the error message I received:
    Error connecting to the target:
    (Error -1060 @ 0x2E1A)
    Device is not responding to the request. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
    (Emulation package 6.0.407.3)
  • 0 in reply to Yitzhak Bolurian
    Prodigy 80 points
    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\yhr\AppData\Local\TEXASI~1\CCS\
    ti\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Jul 27 2016'.
    The library build time was '18:31:37'.
    The library package version is '6.0.407.3'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-zero.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-zero.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]