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CSD18532KCS: How to test the IDSS ?

Went Cao
Genius 5550 points
Part Number: CSD18532KCS

Dear all

       I test the IDSS value, the test conditions are below:

       VGS=0V,VDS=48V,environment temperature=25.6℃,humidity=56.88%RH

       I had test 32pcs devices in total,among them 30pcs devices test the results are right, IDSS<1uA, but two device test results are abnormal, IDSS>200uA.

       Could you share me that how to test the IDSS, and I want to check with my test method.  

       Thanks a lot.

  • 0
    TI__Mastermind 31215 points
    Hi Went,
    Thanks for the question. I am checking with our test team to get you more details on how TI tests IDSS. I will update you as soon as I have this information.
  • 0 in reply to John Wallace1
    TI__Mastermind 31215 points

    Hi Went,

    Please see attached figure. TI tests IDSS the same way you are testing it with VDS = 48V and VGS = 0V. I suspect the 2 devices that failed with IDSS > 250uA may have been damaged during the testing.

  • 0 in reply to John Wallace1
    Genius 5550 points
    Dear John
    Thanks your help.
    In your opinion, they are demaged when I test them.
    But I can not understand, is it demaged by ESD ? or others ?
  • 0 in reply to Went Cao
    TI__Mastermind 31215 points
    Hi Went,
    ESD is a possibile cause of damage. Alternatively, the devices may have been exposed to electrical stress beyond the datasheet absolute maximum ratings due to error such as incorrect connections during the test. All TI devices are 100% tested for IDSS prior to shipment. It is very unlikely that defective devices have been shipped.
  • 0 in reply to John Wallace1
    Genius 5550 points
    Dear John
    Could you tell me how to add ESD circuit when I test the mosfet.
  • 0 in reply to Went Cao
    TI__Mastermind 31215 points
    Hi Went,
    There is not an ESD circuit to add to the test setup. Please make sure to use ESD handling guidelines to prevent damage to the devices during handling and test. While it is possible that the devices could be damaged by ESD it is not likely as long as you're following ESD precautions. It is more likely that devices may have been damaged during the test or insertion into the text fixture or socket. Can you provide more details on your test procedure? How are you connecting the FET to the 48V supply? Is there any possibility that the supply is live or charged when it is connected to the FET? How is the test fixture grounded? Lastly, have you retested the parts that failed?