CSD18536KTT: CSD18536KTTT aging parameters

SIDDHARTH MOHAN

Genius 3205 points

Part Number: CSD18536KTT

Hope this email finds you well.

Wanted to request to know if you maintains reliability data for the discrete mosfets CSD18536KTT ?

By reliability data I mean data which includes aging effect due BTI (bias temperature instability), thermal etc..

over 6 years ago

0 John Wallace1 over 6 years ago

TI__Mastermind 38090 points

Hi Siddharth,
Thank you for your interest in TI MOSFET products. Ongoing reliability data can be found in the product folder for the device here: www.ti.com/.../home.

0 SIDDHARTH MOHAN over 6 years ago in reply to John Wallace1

Genius 3205 points

thank you very much reply John, i was asking more in terms of impact of aging on the spice model parameters for simulation purposes.

0 John Wallace1 over 6 years ago in reply to SIDDHARTH MOHAN

TI__Mastermind 38090 points

Hi Siddharth,
Thanks for the clarification. I have requested the impact of aging on key parameters from our quality engineer. He's currently out of the office. I will update as soon as I have more information.

0 SIDDHARTH MOHAN over 6 years ago in reply to John Wallace1

Genius 3205 points

Thanks for the reply John, let me detail a bit. So suppose the FET is used for 10 years to what will be the change in its current at the end of 10yrs. It is likely that its threshold voltage will increase causing the current to decrease. Similarly there will be change in KP etc… so will be great if this quantification is available. I am aware that this is done for the integrated / on-chip mosfets which are nm devices but not sure for discrete parts.

0 SIDDHARTH MOHAN over 6 years ago in reply to SIDDHARTH MOHAN

Genius 3205 points

Any inputs please thanks

0 John Wallace1 over 6 years ago in reply to SIDDHARTH MOHAN

TI__Mastermind 38090 points

Hello Siddharth,
I checked and TI does not collect this type of data. Our qualification testing is the aging process and our devices past these industry standard test methodologies.

0 SIDDHARTH MOHAN over 6 years ago in reply to John Wallace1

Genius 3205 points

Thanks for the reply John,

"Our qualification testing is the aging process" - so there might be silicon data like threshold voltage degradation with time or similar any other parameter degradation with time. Is that available anywhere ?

0 SIDDHARTH MOHAN over 6 years ago in reply to SIDDHARTH MOHAN

Genius 3205 points

thanks i have accepted the invite.

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CSD18536KTT: CSD18536KTTT aging parameters