Attachment is a captured image with connecting a real system.
For this image, we found gauge has SCD record after this testing. However, why SCD trigger at 2nd event. Could you help to take a look?
Note*. Yellow line is Gate voltage for DFET. Green line is current. Pink line is PACK voltage.
Note**: SCD setting 31.1A for 732us, AOLD settings 20A for 31ms. 
This question is relative to ASCD trip and then DFET turn off.
Trying to reproduce by electric-loader and it can reproduce. Here is our testing process.
1. GG settings : AOLD=20A / 31mSec , ASCD=26A / 732uSec
2. Applying a dynamic Load setting =27A for 0.85 mSec then 20A for 1mSec
==> Check this waveform as below (Y axis is current, X axis is time), DFET is open when apply 2rd pulse.
3. Read our GG file, only ASCD event is to be record.
Please kindly test by EVM. I believe you can see this symptom.
