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TPS65218: Cause of TPS65218B1 problem

Kuramochi Tadahiko
Guru 28715 points
Part Number: TPS65218

Hi,

I'm recognizing that the TPS65218B1 has problem as below file.

http://e2e.ti.com/cfs-file/__key/communityserver-discussions-components-files/196/TPS65218xx_5F00_Rev_5F00_history.pdf

My customer has already been using the TPS65218B1 and afraid that the problem occurs.

If these problems have never happen, will not they occur?

Could you share the cause of these problem?

Best Regards,

Kuramochi

  • 0
    TI__Mastermind 30310 points
    Kuramochi-san,

    The TPS65218 -B1 datasheet is accurate and up-to-date with all of the limitations, which are listed in the Revision History. The Electrical Specifications have modified Min & Max values at the relevant temperature ranges.

    The PDF I posted is simply a consolidated list because the TPS65218D0 datasheet does not say all of the issues that are fixed in the new version of the silicon. Customers who are considering using the new version use the PDF as a guide.

    Customers who were using -B1 silicon at the time of the datasheet revisions received a PCN when the changes were made. The most recent revisions were made in November 2017 and the -B1 device was changed to NRND around April 2018. We strongly encourage that customers qualify the -D0 device, but if they choose not to then they should test the -B1 device across the voltage, current, and temperature conditions listed for the revised specifications to ensure their system operates correctly in the desired application.
  • 0 in reply to Brian Berner
    Guru 28715 points
    Brian-san,

    They are worrying products already shipped, so they must verify if problems can occur.
    If problems can happen, they may need to recall their products.
    Could you share the cause of these problem?
    And, are these problems affected by aging?
    In other words, is there possibility that problems occur by aging?

    Best Regards,
    Kuramochi
  • 0 in reply to Kuramochi Tadahiko
    TI__Mastermind 30310 points

    TQ,

    These issues are not dependent on the aging of the device. 

    They are caused by limitations of the original circuit design. They would be discovered immediately if the conditions (supply voltage, temperature, load current, etc.) are favorable to expose the flaws of the design for -B1 silicon revision.

    This is why the -D0 version was re-designed and fixed the issues.