BQ76PL455A: build in self test

John Chou62

Intellectual 2070 points

Part Number: BQ76PL455A

hi Team,

customer aware of the bq76pl455A there is BIST feature

build in self test, however, there is Test configuration TSTconfig 0x1E-0x1F (7.6.3.15)

but where to check the test result/status after the setting?

Thanks

over 6 years ago

0 Andy Li55 over 6 years ago

TI__Intellectual 2520 points

Hello John,

You can find most of the answer from DS by yourself.

LDO_TEST: I will give comments on this after I check with team;

CCNT_RST_OFF: If you set CTO and then enable this mode, finally chip will go into shutdown and you can detect;

VDIG_TEST: it is used to test short of NPN;

EQ_SQUEEZE_EN: it can be used for open wire detection;

(2) and (4) are result after ADC conversion.

Andy

0 John Chou62 over 6 years ago in reply to Andy Li55

TI__Intellectual 2070 points

Thanks Andy, but we were trying to ask, is there registers to check the test results/status of those items? where does the user check for the test results? Thanks

0 Andy Li55 over 6 years ago in reply to John Chou62

TI__Intellectual 2520 points

Hello John,

For some test, we can get result from some bits;

For some test, host should do further work and then can get result.

If engineers really start to design project, they should know where should they get results.

Thanks!

Andy

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BQ76PL455A: build in self test