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BQ25898D: BQ25898D DSEL Electrical Characteristics

user777540
Expert 1020 points
Part Number: BQ25898D
Other Parts Discussed in Thread: BQ25898

Hello,

I have two questions.

1. Is a pull-up resistor required on the DSEL pin?

BQ25898 DSEL Electrical Characteristics
I have two questions.

1. Is a pull-up resistor required on the DSEL pin?
2. It is described as max0.4V in VDSEL_OL.
TEST CONDITIONS is I (DSEL) = -10 mA and I (REGN) = 30 mA, VBUS = 5 V.
The current of I (DSEL) is 1mA or less.
Even in that case, is VDSEL_OL max0.4V?
Is there any document describing the relationship between current and voltage?
Would you please have it?
VDSEL_OH describes min1.3V.
TEST CONDITIONS is I (DSEL) = 20 mA and I (REGN) = 30 mA, VBUS = 5 V.
The current of I (DSEL) is 1mA or less.
Even in that case, is VDSEL_OH min1.3V?
Is there any document describing the relationship between current and voltage?
Would you please have it?

Regards,

  • 0
    TI__Guru**** 167116 points

    Hi,

    DSEL is push-pull, not open drain and therefore does not require a pull up resistor.  The I(DSEL) values in the test conditions provide you the maximum current sourcing and sinking out of/into DSEL for DSEL to provide its logic high of 1.3Vmin and logic low of 0.4Vmax.  Current sourcing/sinking higher than those values result in un-warrantied DSEL logic high and logic low values.

    Regards,

    Jeff     

  • 0 in reply to Jeff F
    Expert 1020 points

    Hello,

    I solved the pull-up resistor.

    There are additional questions about VDSEL_OL and VDSEL_OH.

    I don't want to increase I (DSEL) over TEST CONDITIONS.

    I thought that by reducing I (DSEL), the max value of VDSEL_OL was lowered and the min value of VDSEL_OH was raised.
    If you have a document (eg graph) of the relationship between VDSEL and I (DSEL), it can be reflected in our circuit design.

    Regards,

  • 0 in reply to user777540
    TI__Guru**** 167116 points

    Hi,

    Unfortunately, I do not have such a document.  The test conditions in that datasheet were the only ones used at IC production test. 

    Regards,

    Jeff