Hi,
We are testing a 3s2p configuration with BQ7791500.
We followed the EVM and connected resistor divider with a power supply as a replacement of the battery.
1) for over voltage the device was just working fine.
2)While testing for OW fault, We removed one of the connection and the device entered the fault state
When we tried recovering the fault state by reconnecting the removed connection the fault state was not recovered.
The fault recovered only when the power source is disconnected and connected again.
3) for under voltage test condition, it was not recovering from the fault condition even after meeting the recovery conditions. To recover the fault condition again the power supply had to be disconnected and reconnected again.
4) For UV fault recovery the suggested method for fault recovery is load removal. We have an application where we cannot disconnected the load ( remove the load). So, instead of removing the load will connecting charger restore the fault condition or removing load is compulsory for recovering the fault conditions?
5) There are few other fault conditions where load removal is required. Our application doesn't support disconnecting of load. So is disconnecting of load compulsory of load recovery or is there any method to recover the fault conditions without disconnecting / removal of load?
6) How to know if the IC is burnt out? We burnt out 2 ic's already. The third one DSGfet gate signal gives 0V and CHGfet gate signal gives 2.53 V no matter which state it is in.
the device doesn't come out of fault conditions for OW and UV fault conditions.
Could you please help me in understanding why the device is behaving this way?
Thank-you
Warm Regards
Harini Krishna
