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BQ40Z50-R1: R_DIS =High during QMax

Part Number: BQ40Z50-R1
Other Parts Discussed in Thread: BQSTUDIO

Hi,

Very consistently, I am observing XCGH and XDSG turns high when charging starts. Upon looking through log file I see R_DIS=1 at the moment of CHG & DSG FET disable. Just before this  IT Status was '0x0818 and now '0x0814. I discharging the battery to 0% RSOC and waiting for 2 hrs before charging it again. I am not seeing any PF flag.P2-55_03102020.gg.csvP2-55_Cycle_17-18_Wb_1.xlsx

The battery typically recovers after 24-36 hours. I am wondering what drives the battery on disabled state..is there any DF settings that are driving this behavior.

I am attaching an excel log file for your review. I have highlighted IT_STATUS change rows. I am also attaching gg file.

Thanks

Sachin

  • Hi Sachin,

    I will take a look at your log file. Can you also upload your srec file?

    Did you select a proper chemistry id? Also, did you see any issue when you did the learning cycle?

    Andy

  • Sachin

        I found the INIT bit in OperationStatusB is set, this suggests the gauge undergoes a reset.

        Is your pack connected to Arbin? Can you try to do charge and discharge independently without communication and log the data with bqstudio?

  • Hi Andy,

    How to create/export srec file for the battery? is there any instruction for it? Yes, the Chem id is selected appropriately. No issue was identified during the learning cycle.

    Thanks

    Sachin

  • Hi Steve,

    I noticed the INIT being HIGH. Why the gauge initiated? what condition causes this to happen? what makes you believe Arbin could be the reason?

    I see this only after the battery has gone for QMAX I believe during REST state and Ra update failed. Why the battery recovers after 24 hrs of wait period? Here is the sequence of IT Status Flag. LDMD was always High. 

    IT_Status (x0056) Sequence of events and Vaious Flag
       
    0x1C 0x08 battery enter into 17th Cycle during Charge (R_DIS High). This started after batter XCGH and XDSH FET closed after a waiting period of >24 hrs
    0x18 0x09  battery in 17th Cycle during Charge (VDQ High VOK High QEN High); charge completed and waits for 2 hrs before entering into discharge mode
    0x18 0x0D battery in 17th Cycle during DisCharge (VDQ High RX High VOK High QEN High)
    0x9C 0x08 battery in 17th Cycle during discharge (NSFM High QEN High VOK High R_DIS high)
    0x18 0x0A battery in 17th Cycle during wait period after disCharge (QMAX High QEN High VOK High)
    0x11 0x08 battery in 17th Cycle during wait period after disCharge (REST High QEN High) and enters 18th cycle charge mode
    0x18 0x08  battery in 18th Cycle during Charge (QEN High VOK High); charge started
    0x14 0x08 battery in 18th Cycle during Charge (QEN High R_DIS High) and Arbn raised flag for unsafe condition because of XCGH and XDSG FET open; INIT in Op B High

    Another question...what happens when protection such as VIMA and VIMR are not enabled in DF setting. 

    Settings Permanent Failure Enabled PF B 0 hex

    and threshold such as this is violated during up to 0% RSOC discharge and wait of 2 hrs after that.  

    Permanent Fail VIMR Delta Threshold 100 mV
    Permanent Fail VIMA Delta Threshold 150 mV

    Thanks

    Sachin

  • VIMR and VIMA should not cause reset if they are disable in protection configuration register.

    I noticed that at the moment when the gauge reset, they reading operation is in abnormal high density, 3 times per second. As you said it is consistent, do you see same high density reading operation when issue occurs in other round test?

    While the bqstudio always reads the gauge in an easier manner, once every 4s or so.

    I suspect something may happening to prevent the internal watchdog count to reset, it is possible for the gauge to do simulation when the state transitioned from relax to charge, when such thing happened all together, a reset could occur. As running simulation also consumes a lot of bandwidth of the gauge.

    This is why I suggest you to communicate the device with bqstudio instead of Arbin, just to exclude the possible cause from communication.

  • Hi,

    I don't see the same high-density data reading (see attachment from another battery). When I see consistently, I mean every time battery enters charging.mode. Is there a way to stop gauge simulation? 

    On the other note, few batteries have been doing charge and discharge using the same Arbin schedule and data log freq without any issue.Channel_13_Cycle_31-32_Wb_1.xlsx

  • Hello Sachin,

    This might mean that we had some drift in present DOD data.

    Can you send a reset command on the failing pack when the voltage is well-relaxed and re-run the same test.

  • Sachin

        I still see a burst reading right before the INIT bit set in operation status B register, it is from row 27757 to 27759, all 3 read in 1 second, it is possible for watchdog overflow take to couple of seconds to cause MCU reset.

        Gauging simulation run can not be disabled once QEN is set, it is dominated by MCU task scheduling mechanism.

        I still suggest to repeat the same charge discharge procedure with communication to the bqStudio to verify the supposition