I ask you about the latch-up of the LMZ23605.
This device has passed the latch-up test under the conditions specified in JESD78.
If current or voltage stress exceeding the conditions specified in JESD78 is applied to the device, are there any measures to prevent destruction?
Please let me know if there is a document that describes latch-up measures.
For example, under the condition of VIN = 0V and VOUT = 5V, will the device be destroyed?