Hi,
I ask you about the latch-up of the LMZ23605.
This device has passed the latch-up test under the conditions specified in JESD78.
Question 1
If current or voltage stress exceeding the conditions specified in JESD78 is applied to the device, are there any measures to prevent destruction?
Please let me know if there is a document that describes latch-up measures.
Question 2
For example, under the condition of VIN = 0V and VOUT = 5V, will the device be destroyed?
Best regards,