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Original question:

LM5111: LM5111 Damaged issue

LM5111: LM5111 Damaged issue

Gary Jiang
Intellectual 980 points
Part Number: LM5111

Hi team,

I will follow up this issue as Lin has asked before. Please see the below link for details:

https://e2e.ti.com/support/power-management/f/196/t/874169?tisearch=e2e-sitesearch&keymatch=LM5111

Now I asked customer to test the resistance from PINs to VEE. Please see the below data in the picture.

Is the damage is caused by the conclusion in the above link, I suppose the INA to VEE resistance should be normal and INB to VEE resistance may be drop to a small value. But now either INA and INB resistance is normal or both of them is lower than normal value.

So can you give me some other assumption that may cause this kind of damaged?

Thank you!

Gary

  • 0
    TI__Genius 13445 points

    Hi Gary,

    With the EOS caused failures from the units (NG #1, #2 + last 3 rows), notice the OUTx stages of the driver are essentially shorts which is likely induced by large inrush current on VCC pins damaging both the internal pullup and pulldown FETs at the driver's output stage. To remedy this issue, I suggest a series resistor on V15 to limit any inrush current and surges or the supply.

    For units #3 through #6, I will need additional information as the impedances alone there do not give sufficient information. To isolate the failure location and determine root cause, can you confirm that INA signal does not follow at OUTA? Or that INB signal does not follow at OUTB?

    Regards,

    -Mamadou