Greetings TI Engineers! I've been using a LM25011 in a product that recently went for an FCC pre-scan. It failed the pre-scan and the cause of EMI violation was traced to the LM25011. Sure enough, we went about tightening the current traces etc, but as a quick fix to see if it would help clear the pre-scan, we added a ferrite bead in series with Pin 1. It seemed to reduce EMI quite a bit so we decided to keep it in the next design revision. However, now we found the IC repeatedly blowing up. After a series of controlled diagnostic tests I have done with and without a bead (and no other changes), I see that with no ferrite bead, subjecting the IC to a sharp startup by abruptly plugging in the board's input to a hot 24V supply (and I did this 50 times) does not harm the IC despite nice sparks at the input connector. However, the moment I introduce the ferrite bead, the IC blows up if I perform even one or two such hot plugins. The bead is 1k.
The design was taken from a Webench simulation. Input is 24V and output is 7V@2A. The above test was done with no load.
What could cause this? Any advice/insights/suggestions?
TIA!
Best - Ram