This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TPS22919: No regeneration after short circuit event on the output

Part Number: TPS22919
Issue description
 
The overcurrent protection circuit was tested with a short on the RAW_VDD to the GND. The load switch controls his output during the short circuit event of the power line as drops the output voltage. Perfect.
The malfunction comes only after that. The current consumption increases on normal operation when the short is released on the output. It shows the regeneration inside the TPS22919 not fully.

The plus non-calculated current consumption causes a problem for the battery lifecycle in this LPWA application.
The current consumption on normal operation after power on:
The malfunction after the short circuit event, the current consumption after power on: jump to 20mA which more than +8mA
  
The malfunction is systematic therefore easy to reproduce.
The risk for the application is not specifically high, because the failure comes up only when a short event precedes it.

Any idea?
Issue description
 
The overcurrent protection circuit was tested with a short on the RAW_VDD to the GND. The load switch controls his output during the short circuit event of the power line as drops the output voltage. Perfect.
The malfunction comes only after that. The current consumption increases on normal operation when the short is released on the output. It shows the regeneration inside the TPS22919 not fully.
The plus non-calculated current consumption causes a problem for the battery lifecycle in this LPWA application.
 
 
The current consumption on normal operation after power on:
cid:image004.png@01D66A6D.6756F560
 
The malfunction after the short circuit event, the current consumption after power on: jump to 20mA which more than +8mA
cid:image005.png@01D66A6D.6756F560
 
The malfunction is systematic therefore easy to reproduce.
 
The risk for the application is not specifically high, because the failure comes up only when a short event precedes it.
 
 
Szabolcs EGRI
Hardware Developer / Test Engineer