This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

BQ76PL455A-Q1: What may cause stack fault?

Part Number: BQ76PL455A-Q1

Hi,

We have observed stack fault in our design of stacked battery modules in two cases:

1. The BQ76PL455A-Q1 board at the end of daisy chain is broken and stack fault is observed. When a new board with BQ76PL455 is replaced, the stack fault is gone.

2. When the temperature is about -20 Celsius degree, DEV fault and stack fault is observed. When temperature increases, the stack fault is gone.

In the datasheet of BQ76PL455, it is said that when the signal at FAULT+- is too noisy or at the wrong frequency, STK_FAULT_ERR can be detected.

What might be the specific reason that may lead to case 2, when low temperature condition is considered.

  • Hello,

    STK_FAULT_ERR gets flagged when a device receives a signal on it's high side FAULT pins that has a higher frequency than expected for a heartbeat signal. In the case of the colder temperature, I would check that you temperature chamber is not generating noise when trying to go to cold temperature. You can probe the high side FAULT pins of the device when the fault triggers to see if there is extra noise in the lines.

    Best regards,

    Leslie