Hi,
We have observed stack fault in our design of stacked battery modules in two cases:
1. The BQ76PL455A-Q1 board at the end of daisy chain is broken and stack fault is observed. When a new board with BQ76PL455 is replaced, the stack fault is gone.
2. When the temperature is about -20 Celsius degree, DEV fault and stack fault is observed. When temperature increases, the stack fault is gone.
In the datasheet of BQ76PL455, it is said that when the signal at FAULT+- is too noisy or at the wrong frequency, STK_FAULT_ERR can be detected.
What might be the specific reason that may lead to case 2, when low temperature condition is considered.