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UCC28070: Short test for each pin

Kaji@PAN
Mastermind 7785 points
Part Number: UCC28070

Hi,

I am doing a short test on each pin of the UCC28070 device.
However, the content of the test is special, and we verify not only shorts between adjacent pins but also shorts for all pins.
Among them, the device will be destroyed by a short circuit under the following conditions.
2 pin and 4 pin
12 pin and 15 pin
4 pin and 8 pin
13 pin and 15 pin
I think I'm doing a special test and I think it's inevitable that this test will destroy the device.
However, I would like your opinion on the following contents.

(question 1)
What is the distance between the above pins inside the device?
(Question 2)
What is the risk of the above pins shorting inside the device?

Best regards,

  • 0
    TI__Genius 9790 points

    Hi, Kaji

    It is normal to see IC is damaged with below shorting test, the damage is not related to internal distance of below pins inside the IC, it is related to the voltage stress.

    2 pin and 4 pin: pin 2 is suppose to connect a resistor GND or connect to PWM pulse for SYNC function, but pin4 is kind of constant voltage,
    12 pin and 15 pin: this is short CAOA to VCC, CAOA can only handle voltage <7V, VDD is very higher than 7V
    4 pin and 8 pin: this is short CSB to VREF=6V, CSB is current sensing which is output signal of CT which should be dis-continuous signal.
    13 pin and 15 pin: this is short VREF to VCC, VREF should be damaged because of overstress

    Yunsheng