Part Number: AM4378
Tool/software:
Hi,
I recently purchased XDS110 and now i am trying to connect debug to my board using the cable , i have done the pinouts and connected the cable to the debugger , but i am getting the below issue:
----[Print the board config pathname(s)]------------------------------------ /home/futura/.ti/ccs2020/0/0/BrdDat/testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100/110/510 class product. This utility will load the adapter 'libjioxds110.so'. The library build date was 'May 23 2025'. The library build time was '13:43:25'. The library package version is '20.2.0.3536'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '5' (0x00000005). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the XDS110 with USB interface. The link from controller to target is direct (without cable). The software is configured for XDS110 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xF003C0C0. Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xF003C0C0. Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xE003C0C0. Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xE0020040. Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xF003C0C0. Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xF003C0C0. Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xE003C0C0. Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xF0020040. The details of the first 8 errors have been provided. The utility will now report only the count of failed tests. Scan tests: 3, skipped: 0, failed: 1 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 2 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 3 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 4 Some of the values were corrupted - 65.6 percent. The JTAG IR Integrity scan-test has failed. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xF0030000. Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xE0020000. Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xE0020000. Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xF0030000. Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xF0030000. Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xE0020000. Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xF0030000. Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xF0030000. The details of the first 8 errors have been provided. The utility will now report only the count of failed tests. Scan tests: 3, skipped: 0, failed: 1 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 2 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 3 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 4 Some of the values were corrupted - 65.6 percent. The JTAG DR Integrity scan-test has failed.
I am providing the schematic of the JTAG session of my board below
I have connected the 3v3d to vtref , we found there was issue in the above and i have connected a 4.7k pull up from TMS and TRSTN to 3v3 and a 0.01uf pull down from TRSTN to GND but that didnt solve the issue, then later we removed the 4.7k pull up from TRSTN and made it pull down using the same resistor ,removing the capacitor,but after that we started getting the below error:
-----[Print the board config pathname(s)]------------------------------------ /home/futura/.ti/ccs2020/0/0/BrdDat/testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100/110/510 class product. This utility will load the adapter 'libjioxds110.so'. The library build date was 'May 23 2025'. The library build time was '13:43:25'. The library package version is '20.2.0.3536'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '5' (0x00000005). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the XDS110 with USB interface. The link from controller to target is direct (without cable). The software is configured for XDS110 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[An error has occurred and this utility has aborted]-------------------- This error is generated by TI's USCIF driver or utilities. The value is '-231' (0xffffff19). The title is 'SC_ERR_PATH_IR_MEASURE'. The explanation is: The measured length of the JTAG IR instruction path is invalid. This indicates that an error exists in the link-delay or scan-path.
Please help us solve this issue and use the debug.I am using CCS 20.2.0 in linux 64bit ubuntu 20.04.
Regards,
Roshan Rajagopal
