Other Parts Discussed in Thread: TMP117
Since this is a PEM, is the calibration valid "forever"? Thanks.
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Dear Derek -
Welcome to E2E and thanks for posting!
The relevant equipment used during manufacturing is calibrated to ISO17025 standard yearly, this is the meaning of NIST traceability at the component level. We do not offer any devices with NIST calibration, this is usually done at the end product level. I can also add for your benefit, that these silicon based parts do not drift in the same manner as RTDs, etc, and therefore in the relative context, would never need further adjustment after shipping from manufacturing site, unless something was off in the layout itself, which is where the offset register could be used during that end product calibration step.
I am not sure what "PEM" means to you, perhaps you would be kind enough to explain.
PEM = Plastic Encapsulated Microcircuit
...perhaps "calibration" was the incorrect term to use, but it seems, from your statement, that the temperature sensor's measurement is verified at the component level using NIST traceable equipment. Also, it seems that the temperature sensors accuracy/precision should not drift overtime due to aging or other phenomenon since it is a silicon based part.
So if the temperature sensor measures -40C (for instance) today, then when it reads -40C 10 years from now, that measurement can be "trusted" to be as accurate/precise as it was when it was first manufactured...?
Thanks for the quick response.
Dear Derek -
These devices may drift around 0.02C in that amount of time, perhaps less (see datasheet parameter Long term stability and drift, where we show that the devices were subjected to 150C for 300 hours, which roughly equates to 10-15 years at 25C) - as the TMP117, which was the next version in this family, was tested for 1000 hours at 150, and had about the same drift #, but this test is equivalent to 356 years of usage at 25C.