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TMCS1101: reducing error by calibration?

Robert Finger
Genius 17377 points
Part Number: TMCS1101

Hi,

The TMCS1101 datasheet lists the sensitity and offset errors. Can this be considered as static error, caused by device to device variations? Or could these errors also change during lifetime?

If they are really due to device variations, could the errors be reduced by customer calibration during board production? I think of doing measurements at e.g. 1 A at 5 A and storing these values in a table. At runtime the connected MCU could correct the measurements. 

Thanks,
  Robert

  • 0
    TI__Mastermind 32260 points

    Hello Robert,

    Calibration can be done and device to device can be reduced.  It is not expected for the error to drift over lifetime.  The one thing that could change is the offset due to external fields but may be small enough that it does not matter.  This offset change in the external magnetic field such as earths magnetic field will be orientation related.  Looking at the +/- of 60µT from the earth may not be a big factor.   See Section 8.1.6 in datasheet.

    During board production calibration will improve the accuracy of the measurement and could be used the way you mentioned.