- Test environment
-> H/W : A board that is designed by ourselves referring to the EVM board
-> S/W : A S/W that is designed by ourselves using Area-scan demo project integrated with SDL.
- S/W Library( : version)
-> mmWave SDK : 03.06.00.00-LTS
-> mmwave industrial toolbox : 4.12.0
-> bios : 6.73.01.01
-> SDL : 01.00.00.10
Hi, we are designing to a sensor unit using IWR6843AOP.
But we are facing to the critical issue related to a fail of initial sequence of SDL in area scan demo project.
I integrated area scan demo with SDL referring to SDL reference project from the resource explore mmwave toolbox.
I followed the frame of SDL reference proejct S/W consisting of the initial diagnostics and the periodic diagnostics.
So, in initial process, before staring sensor(RSS), the initial diagnositics proceed.
The problem is, sometimes, that sensor unit failed the initial process.
The fail point is in VIM ECC test(especially Single bit error).
When I do the debug, the current situation as below.
I have also checked this fault happens when the SDL reference project runs.
When I check the VIM control register, it seems like something happened in RTI-A interrupt.
Do you have any idea or any experience when you use this MCU?
I hope I get the solution or the insight from you.
Thank you in advance.
