Other Parts Discussed in Thread: AWR6843
Hi Ti Teams,
I am ED Wu.
Our teams using 3D_Occupancy_Detection demo with AWR6843AOP and sample PCB designed based on AWR6843.
The SDK version link to mmwave_sdk_03_06
We’ve read the document Self-Calibration in TI’s mmWave Radar Devices.
Furthermore, we hope to use one-time calibration instead of periodic calibration, and have found similar discussions.
We prefer to enable one-time calibration at a fixed period instead of periodic calibration.
Even so, we still want to clearly understand the process and equipment requirements for running calibration and evaluate the possibility of implementation.
The following questions need your answers.
1.Based on the above e2e discussion, we should be able to increase the robustness of the equipment to temperature effects and process differences through the one-time calibration function?
(But I speculate that a complete runtime calibration will have better results.)
2. "Cascade Coherency and Phase Shifter Calibration Application Note" Does the content of this document apply to the AWR6843AOP?
3. There is a set of default LUTs in Ti’s SDK for runtime calibration? But it can only be applied to Ti's EVB. If the user designs the PCB by himself, does it need to be calibrated to obtain the LUT with the corresponding temperature?
4. The LUT structure is described in the AWR1xx Radar Interface Control document. What is the link to this document?
5. Among the calibration list, it seems that only TX power calibration, RX gain calibration, and TX phase shifter calibration are more important? And the users only need to focus on these 3 calibrations?
Please clear up my confusion again, thank you very much.
Regards,
ED