Because of the holidays, TI E2E™ design support forum responses will be delayed from Dec. 25 through Jan. 2. Thank you for your patience.

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

OPT3101: What is the lifecycle of OPT3101?

Part Number: OPT3101

Tool/software:

Dear TI experts,

My customer uses OPT3101 for their new product.

Recently they received the defect of OPT3101. And they are trying to analyze it.

- Do you have an official data of the lifecycle of OPT3101?

The voltage is always supplied to OPT3101 so it is always wake up, and its applidation is the distance measuring sensor in front of elevator.

Best regards,

Chase

  • Hi Chase,

    Can you provide more detail about the behavior that is being observed, and on how many units?

    Best regards,
    Nicole

  • Dear Nicole,

    Thank you for your support.

    the behavior is that the voltage output of INP(pin25) is abnormal so distance measuring is not constant in same condition.

    They produced about 20K units so far and found 15 units defected.

    I attach the schematic for your convenience. Could you find the reason and advise me for preventing this kind of defect?

    (ESD, surge, anything.)

    0576.SCHEMATIC1 - 1.OPT3101.pdf

    And please let me know the life cycle of OPT3101. It is good to send me the official document.

    Best regards,

    Chase

  • Chase,

      The INM and INP pins will supply 1V bias voltage to the photodiode. The nominal measured current for the photodiode will about 200nA. It's nearly impossible to connect a scope or multimeter to the INM and INP pins and get a valid reading. That being said, the Photodiode has a reverse breakdown voltage max at 50V. It has an ESD rating of 1.5kv. This part as well as the INM and INP pins are sensitive to ESD more so than other pins. There is no know end of life failure mechanism in this part. 

    I recommend that the Photodiode be replaced and test the circuit again. Also the parallel capacitor is low voltage and low capacitance, so it is also sensitive to ESD. Ceramic capacitors are also know to crack during manufacture due to heavy downward pressure. Replace one at a time and test afterwards starting with the Photodiode and then the parallel capacitor. Let me know if this resolves the issue. I will investigate other scenarios for possible failure points. I am not aware of the OPT3101 having specific problems.   

  • Dear Gordon,

    Thank you for your support. I will check the point of your suggestion.

    Finally I want to know the life cycle of OPT3101. It is the request of my customer. Can I get official document or other data about it?

    Best regards,

    Chase

  • Chase,

    https://www.ti.com/qualificationsummary/qualsumm/home?actionId=2800

    This should have the FMQR available for download.

    If you have any problems finding what you need, please reach out to your local TI FAE.