HDC3020EVM:Inquiry on HDC3020EVM Long-Term Drift — OQC Limits and Test Method

Part Number: HDC3020EVM

Tool/software:

Hello TI Team,

This is Jisoo Shin from Withtech Co., Ltd.

We are reviewing the specifications of the HDC3020EVM temperature/relative humidity sensor and would appreciate your guidance on the following:

  1. Factory outgoing criteria (OQC limits) for long-term drift
    The datasheet lists long-term drift of RH 0.19 %RH/year and Temp ±0.03 °C/year. Beyond the published specs, could you share any factory pass/fail or acceptance criteria applied in production? Our internal requirement is slightly tighter, so this information will help our evaluation.

  2. Overview of the long-term drift measurement method
    Could you briefly describe the test conditions (temperature/humidity set points, duration) and the methodology used to determine long-term drift? If available, any application notes or qualification reports would be appreciated.

Thank you, and I look forward to your reply.

Best regards,
Jisoo Shin


Withtech Co., Ltd.

  • Jisoo,

    The long-term drift spec is calculated from characterization data, not evaluated in production. Is is based on THB (temp + humidity bias) for an extended period of time. Those results are then used with the Arrhenius-Peck acceleration model to create the long term drift spec in the datasheet. THB is performed at 85°C and 85%RH.

    Thanks

    -Alex Thompson

  • 친애하는 알렉스 톰슨에게,

    신속한 답변 감사합니다.

    당사의 예상 작동 환경은 최대 45°C , ≤50% RH 입니다. 표준 85°C/85% RH 프로파일이 아닌, 이러한 낮은 조건에서 모델링된 장기 드리프트 특성 분석이 포함된 데이터시트나 애플리케이션 노트가 있습니까 ?

    귀하의 지원에 감사드립니다.

  • Dear Alex Thompson,

    Thank you for your prompt reply.

    Our intended operating environment is up to 45°C and ≤50% RH. Do you have a datasheet or application note with long-term drift characterization modeled under these lower conditions, rather than the standard 85°C/85% RH profile?

    If not, any guidance or model parameters for extrapolating long-term drift from 85/85 to our use case would be greatly appreciated (e.g., acceleration/Peck or Arrhenius-type modeling), along with a brief note on the test setup and duration used.

    Thank you for your support.

    Best regards,
    Jisoo Shin