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TMP175: bearable EOS and ECD data and Drop test result (Urgent)

Khai Lee
Prodigy 180 points
Other Parts Discussed in Thread: TMP175

Dear Team,

I am Khai Lee, Field Application Engineer in TI Korea.

I always thank for your grateful supports everyday.

I got an urgent request from a customer regarding TMP175.

My Customer required below data about TMP175.

1. EOS(Electrical Over Stress) data for each pin 

- I think the customer wants ESD data. However, if you have any test result related with EOS failure please send it to me.

2.  Drop test result with G( acceleration of gravity)

Like I told you, this is a very urgent request.

I know you have a lot of issues and requests from all over the world, but please put this in the high priority in this time.

Thank you for your supports and kind understanding.

  • 0
    TI__Expert 7945 points

    Hello Khai,

    The ESD data for all the pins is as follows:

    ESD HBM

    500V, 1000V, 1500V, 2000V, 3000V*, 4000V*

    PA4649 TMP75AID

    ESD CDM

    200V, 500V, 750V*, 1000V*

    We inquired around with various quality and failure analysis teams to find that drop tests are not part of our standard quality analysis here in TI, especially for small IC's will just 8 pins. Can you please give us more insights about the customer, their volumes and how inclined is the customer towards using our devices? because sometimes the team might be inclined towards building a test on priority basis. I would like to service your request soon and so lets take this conversation to my email (abhishekmuppiri@ti.com)

    Best Regards,

    Abhi Muppiri

    Applications Engineer

    MHR- Sensing Products

    Texas Instruments

    -----------------------------------------------------------------------------------------------------------------------------------

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