Dear Sirs,
As my customer testing, if they place the IR source in environment(not close to OPT3001), then the OPT3001 reading data is OK.
However, once the IR source is close to OPT3001, the reading data will be very large.
Is the testing method of IR rejection is OK or not? It no, how to test the IR rejection performance in customer side?
If the method is OK, what is the problem for this issue?
Attached is the snapshot of connection of OPT3001 EVM and customer PCB.
Please give me some advice.
Thanks.