Hi,
In C:\ti\mmwave_sdk_01_00_00_05\packages\ti\drivers\adcbuf\test\common\test_adcbuf.c, it seems that ADC buffer can output test pattern for debug purpose.
What is the detail data in this test pattern? Are they random data? Can the test pattern to be user defined? My customer wants to send a known data from adc buffer to LVDS for debug purpose.