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IWR1443BOOST: High accuracy sub-mm measurement across surface

Part Number: IWR1443BOOST

Hi,

We are planning to use the device to measure differences in the surface of a material; example would be 300 µm deep in the center, relative to 0 µm on the edges.  Let's say the surface of interest is 0.5 square meter.  From my understanding this may be troublesome to measure, since the azimuth resolution is 15 degrees in a 4-Rx configuration.  The high-accuracy demos seem to be running on a 1-Rx and Tx configuration, and displaying range only;  this may pick up false echos because of the large azimuth resolution.  Is this kind of application feasible with the IWR1443BOOST module?  I am unsure if offsetting the radar or object laterally to perform measurements at the edge is an option, since the movement in the lateral direction may have µm movement in the range direction as well.  

I have read that TI has used lens to focus the beam.  Redesigning the antennas to have a narrow beamwidth may be an option, but we are focused on just using the IWR1443BOOST instead of fabricating different parts.  https://e2e.ti.com/support/sensor/mmwave_sensors/f/1023/t/638403?tisearch=e2e-sitesearch&keymatch=4%20mm%20resolution%20iwr1443

Any words of advice?

Thanks!