Other Parts Discussed in Thread: IWR1443
Is it possible to use the IWR1443 (or other chips in the range) to detect the scattered spectral response (i.e. RCS versus frequency)? Or does the matched filter inhibit us from doing this?
Objects may exhibit RCS variation with frequency, which is useful to know for classification. I would be interested to know whether this can be measured (I'd like to compare it to measurements from a quasi-optics VNA setup).