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IWR1443: Test Pattern Generator

Gennadii Lichkov
Intellectual 930 points
Part Number: IWR1443

Hi,
I use Test Pattern Generator from ADC buffer.
It generates 16 samplese 4 byte each.
I use code from ti\drivers\adcbuf\test

testPatternConf.period = 255;
testPatternConf.numSamples = 16;

for (channel=0; channel < 4; channel++)
{
testPatternConf.rxConfig[channel].rxIOffset = 0x0000;
testPatternConf.rxConfig[channel].rxIInc = 1;
testPatternConf.rxConfig[channel].rxQOffset = 0x1000 ;
testPatternConf.rxConfig[channel].rxQInc = 1;
}


rv = ADCBuf_control( handle, ADCBufMMWave_CMD_CONF_TEST_PATTERN, (void *)&testPatternConf );
if( rv < 0 )
{
System_printf("Error: ADCBufMMWave_CMD_CONF_TEST_PATTERN failed with [Error=%d]\n", rv);
return rv;
}

I expect to see in ADCBUF
0x10000000 0x10010001 0x10020002 and so on

But there are
0x10310031 0x10320032 0x10330033 and so on

The offset is permanent and depends on numSamples

Is this offset normal behavior for Pattern Generator?

Regards,
Gennadii

  • 0
    TI__Guru 50240 points

    Hi Gennadii,

    I've asked an expert to look into this and we should have an answer for you in the next few days.

     

    Cheers,

    Akash

  • 0 in reply to Akash Gondalia
    TI__Mastermind 25835 points

    Gennadii,

       Please review the driver code in the below link. 

    If there is a miss in the capture then this could be expected. Also if the sequence is not followed correctly, i.e.Test source is triggered first and captured later then there could be some codes would have been missed.

    Also, Please follow the steps in the below test function, from the above code snippet, we cannot predict it is followed correctly or not. 

    ti\drivers\adcbuf\test\common\test_adcbuf.c (Test_ADCBUFContDataPathWithTestPattern). 

    Thanks and regards,

    CHETHAN KUMAR Y.B.