Please tell me the degree of variation in the measured values when changing the IC in FDC1004.
It is easy to understand if the measurement target is the degree of variation in the measured values when the ceramic capacitor is 0.5pF.
Thank you.
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Please tell me the degree of variation in the measured values when changing the IC in FDC1004.
It is easy to understand if the measurement target is the degree of variation in the measured values when the ceramic capacitor is 0.5pF.
Thank you.
Masayuki,
Thank you for your inquiry and your interest in TI products.
Just so I can be sure I understand your question:
Are you looking for the tolerance of the capacitance measured by the FDC1004 when you simply change the IC and the PCB & components remain the same between the measurements?
Regards,
John
Hi, John.
Your understanding is probably correct.
PCB:not change
components(measurement target?):not change
FDC1004:change
I want to know how different the measured values are at this time.
Hello Masayuki,
The absolute error after offset calibration has a typical value of ±6 fF. This specification can be seen in section 7.5 of the datasheet.
Best regards,
Nicole
Hi, Nicole.
How many Gain Calibration is at 6fF?
What happens if I don't do offset calibration? Is it indefinite?
Hi Masayuki,
The parasitic capacitances of the FDC1004 are calibrated out at production. These parasitic capacitances can come from factors such as the initial capacitance of the sensor, or parasitic capacitances of the board traces and sensor connections. The gain is factory calibrated up to ±15pF for each part.
If there are other sources of offset, it may be necessary to further calibrate in the application. The maximum offset capacitance is 100pF. For more information, sections 8.3.2 - 8.3.4 of the datasheet offer further details.
Best regards,
Nicole