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TPS53511: FMD DATA COLLECTION: TEXAS INSTRUMENTS

Part Number: TPS53511

TEXAS INSTRUMENTS_12TH_MAR_26.xlsx.  - EXCEL SHEET

Hi TEXAS INSTRUMENTS Team, 

Good day..!!
 
This is Siddesh Chavan from NetApp Component Engineering Team.

As part of our ongoing component compliance review and internal documentation update process, we are currently evaluating TEXAS INSTRUMENTS parts that your organization supplies to us. 

To ensure our records remain accurate and fully aligned with regulatory requirements, we kindly request your support in providing detailed and updated information for all the components listed in the attached file.

Kindly acknowledge receipt of this email and confirm that the work has commenced. 

We would appreciate it if you could share the completed information on or before 18TH March 2026

Thank you for your support.

Note: 

Technology Node: Represents the semiconductor manufacturing process generation (in nm/µm), indicating the minimum feature size used in IC fabrication (e.g., 28 nm, 7 nm).

Country of Origin (COO): Provide the final assembly/testing country.

Type of Conflict Minerals: Specify elements (e.g. Tin (Sn), Tantalum (Ta), Tungsten (W), Gold (Au)) are present into component.

CAS Numbers: Provide CAS numbers for substances reportable under RoHS/REACH.

Type of REEs: Specify elements (Lanthanum (La), Cerium (Ce), Praseodymium (Pr), Neodymium (Nd), Promethium (Pm), Samarium (Sm), Europium (Eu), Gadolinium (Gd), Terbium (Tb), Dysprosium (Dy), Holmium (Ho), Erbium (Er), Thulium (Tm), Ytterbium (Yb), Lutetium (Lu), Scandium (Sc), and Yttrium (Y)) are present in the component.

Package Dimensions (mm): Provide dimensions millimeters (mm). Package Dimension = length x width x height

Die Count: Indicate the number of silicon dies in the package.

Die Area (mm²): Provide the die area in square millimeters (mm²).

Die Thickness (mm): Provide the die thickness in mm.

Die Dimensions (mm): Provide nominal die size in mm. Die Dimension = length x width

Die Weight (mg): Provide the die weight in milligrams (mg). Die Weight (mg) = Die Area × Die Thickness × Silicon Density

Regards,

Siddesh Chavan