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SN74LVC1G3157-Q1: Durability against Latch-up

Part Number: SN74LVC1G3157-Q1

Hello, team,

Customer is currently investigating their issue and would like to know the effect of analog-switch being latched-up.
This is needed because they want to narrow down the causes of this issue.

  1. For example, if the device suffered an excessive surge and latched-up, is there a possibility that below a & b happens at the same time?:
    1. the switch state is fixed and never change
    2. the device did not malfunction and recover after reboot
  2. Could you please tell us the worst condition when testing the latch-up function of this device?
    1. Any difference in latch-up durability between each VIO pins
    2. There should be many tests to confirm latch-up durability such as pulse current injection method.
      Is it possible to tell us the result for those tests?
      We would like to know which test is the worst case scenario and the testing procedure/condition of it.

Best Regards,
Masaru Oinaga