I am using the TS3USB31ERSER and have found a greater than expected failure rate of either one switch or the other. From the USB connector the VBUS and GND signals each pass through a ferrite bead. The VBUS (post ferrite bead), D+, and D- signals are connected to a TPD4S012DRYR and then to the TS3USB31ERSER. The USB switches work well enough to get through assembly testing, but some have failed final testing. One possibility is that there was ESD damage during final testing. I did a fair amount of ESD testing during the design phase and never had a problem. The failure is that the switch remains open even when the enable signal is asserted. Does anyone have any suggestions as to what might be happening?
Thanks,
Elizabeth