TMDXEVM6670LE EVM & the BIOS MCSDK Getting Started Guide

Steve Johnson94170

I recently purchaced a TMDXEVM6670LE EVM and I am attempting to go through the BIOS MCSDK 2.0 Getting Started Guide. I have successfully completed the "quick start guide" and was able to execute the "out of the box" demo. However, I can't get the target to connect when using the "XDS100v1 USB Emulator". I currently have the following versions installed:

CCS: v5.1.0.09000

BIOS MCSDK v2.0.3

I get the following error message when I "Right Click on core0 and select "Connect Target"

-----------------------

Error connecting to the target

(Error - 2131@0x0)

Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG setings (e.g. lower TCLK).

----------------------------

I have attempted reseting the device, power cycling the board, and tried lowering the JTAG TCLK setting to its minimum value. Nothing works. Any advice would be greatly appricieated.

Steve Johnson

over 13 years ago

0 Ki over 13 years ago

TI__Guru**** 472001 points

Hello Steve,

Could you run the jtag diagnostics for your connection? In your ccxml file, there should be a button called "Test Connection". See slides 76 and 77 of: http://software-dl.ti.com/dsps/dsps_public_sw/sdo_ccstudio/workshops/CCSv5/C2000/CCSv5-Workshop%28C2000%29.pdf

Thanks

0 Steve Johnson94170 over 13 years ago in reply to Ki

Prodigy 50 points

Ki,

Thanks for the reply. Here is what I get.

Steve

[Start]

Execute the command:

%ccs_base%/common/uscif/dbgjtag.exe -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.

This utility will load the adapter 'jioserdesusb.dll'.

The library build date was 'Oct 27 2011'.

The library build time was '17:12:35'.

The library package version is '5.0.520.0'.

The library component version is '35.34.38.0'.

The controller does not use a programmable FPGA.

The controller has a version number of '4' (0x00000004).

The controller has an insertion length of '0' (0x00000000).

This utility will now attempt to reset the controller.

This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.

The controller is the FTDI FT2232 with USB interface.

The link from controller to target is direct (without cable).

The software is configured for FTDI FT2232 features.

The controller cannot monitor the value on the EMU[0] pin.

The controller cannot monitor the value on the EMU[1] pin.

The controller cannot control the timing on output pins.

The controller cannot control the timing on input pins.

The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length failed.

The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.

The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 512 32-bit words.

This test will be applied just once.

Do a test using 0xFFFFFFFF.

Scan tests: 1, skipped: 0, failed: 0

Do a test using 0x00000000.

Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

The details of the first 8 errors have been provided.

The utility will now report only the count of failed tests.

Scan tests: 2, skipped: 0, failed: 1

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 2

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 3

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 4

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 5

Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------