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xds 100 v1 emulator for exper kit docking station problem

shady mamdouh
Intellectual 575 points

hello

I was working with eZdsp f28335 and CCS V3.3 properly

but Now, I have the exp kit with dock station f28335 but I have problem with the connection bet it and CCS 

when I go to ti wiki site, i found that i should install 

XDS100 SW required. Download here.

but when i begin to install it , a window appeared saying that CCS must be installed first 

the CCS is already installed 

What can I do?

  • 0
    Guru 192875 points
    Hi Shady,

    Actually F28335 docking station has XDS100v2 and not v1. Also, XDS100v2 is not supported by CCS v3.x and hence you'll have to either migrate or start developing your project with the later versions... CCS v6.1 the latest and is very much recommended.

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 575 points
    i use now CCS V4 but an error appeared now saying:

    Error connecting to the target:
    (Error -1041 @ 0x0)
    The emulator reported an error. Confirm emulator configuration and connections, reset the emulator, and retry the operation.
    (Release 5.0.429.0)
  • 0 in reply to shady mamdouh
    Intellectual 575 points
    in the "Devices and Printers" tab of Control Panel it is Unspecified Device called "Texas Instruments XDS 100+Rs232 V1"
  • 0 in reply to shady mamdouh
    Guru 192875 points

    Can you check your Device Manager? If possible paste the screenshot of the same, it should look something like this:                      

  • 0 in reply to Gautam Iyer
    Intellectual 575 points

    yes it looks like that

  • 0 in reply to shady mamdouh
    Guru 192875 points
    But did you change to XDS100v2 in target configuration in CCS v4? Also, please update to CCS v6.1 which is the latest and helping you would be much easier.
  • 0 in reply to Gautam Iyer
    Intellectual 575 points
    Although the device manager shows that XDS is specified correctly , in the "Devices and Printers" tab of Control Panel there is Unspecified Device called "Texas Instruments XDS 100+Rs232 V1"
    i tried for both v1 and v2 and the same error occured
    I use MATLAB for programming , is CCS v6 support MATLAB?
  • 0 in reply to shady mamdouh
    Guru 192875 points
    You can try CCS v5.5 with Matlab. Refer this link: in.mathworks.com/.../25472-ccs-5-1-integration-when-and-how
  • 0 in reply to Gautam Iyer
    Intellectual 575 points
    i used CCS V5 and use the test connection button but this appeared :
    The JTAG DR Integrity scan-test has failed.
  • 0 in reply to shady mamdouh
    Intellectual 575 points

    please i need help urgently: 

    i use CCS V5 and this error appeared when i press connection test "

    [Start]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\eg\AppData\Local\.TI\2632703525\
    0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Aug 20 2013'.
    The library build time was '22:56:19'.
    The library package version is '5.1.232.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-zero.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-zero.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End]