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CC2564C: test mode

Cherry Zhou
Mastermind 22235 points
Part Number: CC2564C


Hi team,

Here's an issue from the customer may need your help:

The CC256x Testing Guide - Texas Instruments Wiki.pdf contains methods to build BT SIG tests and RF.TS.p30e2.pdf contains the various test metrics defined by SIG, such as: RF/TRM/CA/BV-01-C [Output Power], RF/TRM/CA/BV-02-C [Power density], RF/RCV/CA/BV-01-C [Sensitivity – single slot packages].

Issue: after tester and DUT establish tests (test activate is complete), how to control DUT to switch between each test case? (Such as switching from test RF/TRM/CA/BV-01-C [Output Power] to test RF/RCV/CA/BV-01-C [Sensitivity – single slot packets])

Could you help check this case? Thanks.

Best Regards,

Cherry

  • 0
    TI__Expert 7950 points

    Hi Cherry,

    In this case the CC256x is controlled by the Bluetooth Tester, as shown in the "BT RF SIG Mode" on page 4 of the CC256x Testing Guide. The HCI commands shown can be used to put the device in test RF SIG mode. Once the proper sequence has been completed (first loading the BT service pack and then the DUT script), then the BT tester will take control of the device through the RF link (LMP).

    At this point, the Bluetooth Tester is responsible for conducting each test.

    Best regards,

    Jesse