CC2640R2F: Transmit/Receive simultaneously during EMC testing

Kenton McFaul

Part Number: CC2640R2F

Good afternoon!

Our Bluetooth devices are currently undergoing EMC testing. They are running the Host Test project for the original blestack (SDK 5.30.00.03).

For RX immunity testing, the test lab would prefer that the device transmit and receive during a single test scan.

Do either the Smart RF Studio tests (e.g., "Continuous TX", "Packet TX") or BTool tests (e.g., "HCIExt_ModemTestTxCmd", "HCI_LE_TransmitterTest") incorporate any bi-directional communication? (i.e., are handshake packets sent and received during the test?)

Thanks!

-Kenton

over 3 years ago

+1 Jan over 3 years ago

TI__Mastermind 43400 points

Hi Kenton,

The description for the HCI_LE_TransmitterTest is provided by the Bluetooth LE 4.2 specification and is shown below:

A description of the HCI_EXT_ModemTestTxCmd() can be found in the API guide:

I don't believe the packet TX or continuous TX in SmartRF studio do any RX activity.

I would also suggest referencing the Configuring Bluetooth LE devices for Direct Test Mode and the How to Certify Your Bluetooth Product application reports as these contain valuable information with regards to certification testing.

Best Regards,

Jan

0 Kenton McFaul over 3 years ago in reply to Jan

Prodigy 155 points

Thank you, Jan!

I was wondering partly about the underlying protocol operation.

For example... If one device is running the HCI_LE_TransmitterTest or HCIExt_ModemTestTxCmd, and another device is running the HCI_LE_RecieverTest or HCIExt_ModemTestRxCmd... is there some sort of bi-directional exchange of data (e.g., acknowledgement packets), or is data transfer only unidirectional (i.e., from transmitter to receiver)?

-Kenton

+1 Jan over 3 years ago in reply to Kenton McFaul

TI__Mastermind 43400 points

Hi Kenton,

I do not believe there is any bidirectional data transfer in those commands as the TX command simply sends a carrier wave signal.

Best Regards,

Jan

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CC2640R2F: Transmit/Receive simultaneously during EMC testing