This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

CC2340R5: While testing with HCI TX transmitter test, negative TX power values were measured.

Part Number: CC2340R5


Hi TI members,

Below is my building environment:

Software

Version

Code Composer Studio

12.4.0.00007

SimpleLink SDK

7.20.01.10

XDCtools

3.62.1.16_core

We have used basic_ble_ptm to do the RF testing with HCI commands, such as  HCI_LE_TransmitterTest and HCI_LE_TestEnd.

While stress testing the DUT, we observed several negative values in TX power, and needed to reset the chip to get rid of the situation.

Within a 100 times testing, we could observed this issue for about 5 times, and they all occurred randomly.

Plus, no matter low/high/middle channel, the phenomenon was only observed in TX power, while we tested both TX and RX transmitter test. 

We would like to know if there are any configurations we can modify or how can we resolve this issue?

Please help us identify the problem.

Thanks.

BR,

YuWen