Other Parts Discussed in Thread: SYSCONFIG
Tool/software:
Hi champs,
For CEM qualification of a CC2674 product, a DTM test is being held here – the HW configuration is based on internal bias / differential mode.
Un CCS project is used here (with no modification). The syscfg file is attached. The internal bias / differential mode is selected but when measuring the conducted emission, a -60dBm sensitivity is observed which seems to correspond to a wrong configuration of the bias (External)
BUT, when using smartRF studio, and when setting the biasMode register to ‘0’, the sensitivity is measured at -90dBm (see snapshots here below) as expected
Could you tell what could be the issue here ? Why the internal bias / differential mode does not seem to be taken into account on the first measurement ?
Thank you!
Best regards,
Guillaume
https://e2e.ti.com/cfs-file/__key/communityserver-discussions-components-files/538/1667.host_5F00_test.syscfg