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CC2640R2F: Test Fail at carrier frequency drift and offset

Mike Wu1
Genius 3356 points

Part Number: CC2640R2F

Tool/software:

My Team,

My customer is currently performing RF conducted measurements on the TI CC2640R2F and encountered an issue related to carrier frequency drift and offset. While the Tx output power and receiver sensitivity are within expected parameters, the carrier frequency drift and offset occasionally fail to meet the Bluetooth SIG PHY specification limits.

Please note that the Tx power setting is configured at 0 dBm during the tests.

Here are some details of the test setup for your reference:

  • Measurement Instrument: IQxel-M
  • Measurement Method: Conducted
  • Test Software: TI BTool

I’ve attached a short video, screenshots, and the BTool configuration settings used during the tests.

Could you kindly help me investigate this issue or advise on how to fix it?

The HW design is also requesting TI AE's review.

Your prompt support on this matter would be greatly appreciated.