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CC2640R2F: Debugging Field Issues on CC2640R2F

Part Number: CC2640R2F

I have been looking at all the debugging techniques available on the CC2640R2F and most seem to assume that a debugger is connected to the device. Is there any way to debug crashes detected in the field. Both for issues possibly within the stack as well as for issues caused due to defects in the application.

Is the inbuilt Non Volatile memory used for storing any kind of logs/core files etc?

  • Hello,

    Although we do not provide any examples of storing error or other diagnostic information, you can use the Simple NV (SNV) APIs to store custom data to NVM. Also, one way of implementing a panic logging mechanism is described in this post:
    e2e.ti.com/.../1982253

    Refer to the Flash Memory section of the BLE SW User's Guide in the SDK for more info on SNV usage.

    Best wishes
  • Hi,
    Thanks for the response, what I wanted to understand is any diagnostic information stored by default by the TI/RTOS kernel or the BLE Stack without any additional code within the application program. Which can be later passed on to the TI team for additional debugging of core components. Ex - a core file which is generated etc.
    Regards,
    Rahul Jose
  • Rahul Jose31 said:
    Thanks for the response, what I wanted to understand is any diagnostic information stored by default by the TI/RTOS kernel or the BLE Stack without any additional code within the application program. Which can be later passed on to the TI team for additional debugging of core components. Ex - a core file which is generated etc.

    No, nothing is logged into any NV storage. Having an attached debugger is pretty much the preferred way to examine your code.