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CC110L: Mass Production Testing and Output Power Values

Part Number: CC110L
Other Parts Discussed in Thread: CC1200EMK-420-470

Hello,

I have a question regarding the mass production testing of the RF transceiver, CC110L. In the RF Transmit section of the datasheet, for the Output Power at the highest setting, only a typical value is provided. I am interested in designing based on the minimum TX power value rather than the typical one.

Could you please confirm the mass production testing method for this IC and also provide information on the range of values for the Output Power?

Thanks,
Babak

  • Hi Babak,
    I will need some time to collect this information (I also need to confirm what information we can share on a public forum) - please expect an update by Friday, but I will try and get it to you before if possible.

    Regards,

    Zack

  • Hi Zack,

    Thank you. I am looking forward to hearing from you.

    Regards,

    Babak

  • Hi Babak,

    What frequency band are you planning to use?

    Regards,

    Zack

  • Hi Zack,

    My plan is to use 433MHz.

    Best,

    Babak

  • Hi Zack,

    I just wanted to follow up about this topic.

    Thanks,

    Babak

  • Zack,

    Any updates?

  • Typically the absolute output power is not measured, or in other words the output power is most likely not measured in dBm so I doubt you will find the number useful. Also, to comply with some regulations, you typically need to know the maximum number meaning that using a minimum could create some issues later. 

  • I am aware of the regulations, but what I want to know is the minimum TX power of this IC when I set the TX power to maximum. This can help me firstly consider the worst cases for range coverage and also consider this in my PCBA mass production testing. 

    I believe there should be a mass production testing case for the output power of this IC. If an IC fails to reach the minimum value, TI will not sell it!

  • Hi Babak,

    I have done some digging and the most useful data I can provide is the characterisation data.

    There are some important points associated with this data:

    • The RF performance depends on many factors. The reference design used is highly important (due to the RF matching) and the operating temperature(s)/voltage(s) are also major factors (as shown below), which is why we specifically list the typical performance in the datasheet. The characterisation data will give a more comprehensive indication of performance over different conditions, not a guarantee.
    • The reference design and conditions used for a given set of data in the datasheet are listed in the relevant sections. The typical data is extracted from the wider dataset.
    • For TX testing, the device population used is deliberately skewed to cover the process corners as well as a set of typical devices. This device population is then tested over temperature and voltage, over a range of PHYs - these characterised PHYs are then listed in SmartRF Studio as the recommended settings.

    For 433.92 MHz at the +10 dBm PA table setting (0xC0), the following was measured over the entire test population:

    1.83 V:

    Temperature (C) Minimum Output Power (dBm) Average Output Power (dBm) Maximum Output Power (dBm)
    -40 10.34 10.43 10.57
    25 9.84 9.92 10.03
    85 9.37 9.44 9.54

    3 V:

    Temperature (C) Minimum Output Power (dBm) Average Output Power (dBm) Maximum Output Power (dBm)
    -40 10.65 10.81 11.02
    25 10.24 10.34 10.54
    85 9.80 9.92 10.10

    3.6 V:

    Temperature (C) Minimum Output Power (dBm) Average Output Power (dBm) Maximum Output Power (dBm)
    -40 10.64 10.81 11.02
    25 10.24 10.35 10.55
    85 9.80 9.92 10.10

    Regards,

    Zack

  • Hi Zack,

    Thanks for the info. It seems that these are R&D data and I'm still curious about mass production tests for TX output power. Is there a minimum power test? Not looking for the max, just the minimum.

    Best,

    Babak

  • The individual devices can't be tested in that way - you need the additional RF matching, i.e. to be mounted on a reference design.

    In the fab, the production tests would trim the device register values to be within a certain threshold (or reject a given device), depending on the specific device, but this would typically be concerned with current measurements rather than an output power measurement (in dBm). Your design will also have an effect on the output power, including your antenna design.

    So, that kind of data would typically be used to check a certain batch of devices to investigate something specific rather than being able to give a min/max value of output power.

    The characterisation data is the most useful for using as a reference for the range of output power values to expect using the recommended reference design. If the devices pass the production testing, they should produce the range of values measured during characterisation.

    For your production testing, we would recommended using the characterisation data provided as an indication but you must also consider your specific design if you make any changes from the reference.

    Regards,

    Zack 

  • Zack, 

    Thank you for your prompt response and your time. I understand your point, but I have a question regarding the mass production testing of your RF Evaluation Kits with matching circuit and antenna (Like CC1200EMK-420-470). Is output power testing performed on these? I am interested in understanding your testing approach so that I can implement a similar process for my device.

    Thanks,
    Babak

  • Hi Babak,

    I will need to check this - we do have recommended production tests for our later boards (our LaunchPad platforms), so I will aim to get back to you next week with this information regarding our evaluation kits (it should be quicker to find this than measurement data).

    Regards,

    Zack

  • I remembered that we have already produced an App Note for exactly this purpose: 

    SWRA468 (Final Test Considerations for Wireless Technology Products): https://www.ti.com/lit/swra468

    This provides guidelines for the recommended high volume test procedure(s) for your product.

    As mentioned previously, the RF performance will depend on your specific design, with the characterisation data indicating the expected performance. The ICs themselves are screened as mentioned above, but component tolerances, PCB tolerances, and other manufacturing variations will have an effect on the performance so it is not possible to give an exact output power range beyond the characterisation data.

    You can always submit your design for a (confidential) review using Sub-1 GHz Design Review Submission: https://www.ti.com/tool/SIMPLELINK-SUB1GHZ-DESIGN-REVIEWS to give additional confidence in your design before manufacturing board prototypes.

    Hopefully this helps your production processes!

    Regards,

    Zack