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CC1310: RF Performance Degradation

Easwar A
Prodigy 20 points
Part Number: CC1310


Tool/software:

We have been using Qualcomm SAW filter (Part Number: B39871B3717U410)  which incorporates the TI CC1310 chipset.
Issue Summary:
The affected product was assembled and tested successfully in February 2021 and subsequently shipped to the customer.
However, the customer did not install or power on the unit for approximately 3 to 4 years. During this time, the unit was stored in both indoor and outdoor environments.
Recently Observed Behavior:
During installation, our team identified a significant issue with RF communication performance. After detailed troubleshooting, the following was observed:
Up to 80% degradation in RF communication range.
No issues found in firmware or digital circuitry.
The degradation was isolated to the RF path, specifically pointing to the SAW filter.
We would appreciate any relevant data, failure modes, or guidance you can share to support our analysis and preventive actions moving forward.
Product Summary:
Product: Individual Lamp Monitoring RF Unit
Chipset: TI CC1310
SAW Filter Part Number: B39871B3717U410
Assembly Date: February 2021
Storage Duration: ~4 years (Assembled and unpowered)
Used Cabinet: IP67
Storage Conditions: Indoor/outdoor (approx 50 degree Celsius)
  • 0
    TI__Mastermind 35070 points

    Hi,

    Sorry to hear about this issue.

    Have you tried A/B testing?
    I'll check with the device experts if we have such data available for CC1310; at the same time, for the Qualcomm part, have you reached out to them about this issue?

    Thanks,
    Toby

  • 0 in reply to Toby
    Prodigy 20 points

    Hi Toby,

    We did a initial test  before the degrade and after degrade in this case after degrade RSSI result is above -95dBm but the before degrade we got values -60 to  -70 dBm

  • 0 in reply to Easwar A
    TI__Mastermind 18655 points

    Hi,

    Please can you clarify whether the RX performance is regained if you replace the SAW filter with a part that wasn't stored in the same conditions?

    As Toby mentioned, if you perform A/B testing with the device what are the observed results?

    Regards,
    Zack

  • 0 in reply to ZC
    Prodigy 20 points

    Hi 

    As I said earlier,

    We did a test before the degrade and after degrade in this case after degrade RSSI result is above -95dBm but the before degrade we got values -60 to  -70 dBm

  • 0 in reply to Easwar A
    TI__Mastermind 18655 points

    Hi,

    Yes but that does not answer the questions we asked to try and isolate the root cause. We cannot futher investigate the issue if the only information we have is that before storage the reported RSSI result was between -60 dBm to -70 dBm and after storage it is reported as above -95 dBm. More tests are required.

    If a degradation of the SAW filter performance is found to be the root cause, you will need to reach out to Qualcomm regarding that part.

    Regards,

    Zack