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CCS/CC3220SF-LAUNCHXL: Cannnot start CC3220 debugger

Part Number: CC3220SF-LAUNCHXL
Other Parts Discussed in Thread: CC3220SF, UNIFLASH

Tool/software: Code Composer Studio

I'm attempting to follow the guide at:

http://dev.ti.com/tirex/content/simplelink_cc32xx_sdk_1_50_00_06/docs/simplelink_mcu_sdk/Quick_Start_Guide.html

I have successfully built the project out_of_box_CC3220SF_LAUNCHXL_freertos_ccs

The first time I tried to debug the project, I saw the error dialogue about updating the XDS110 firmware, this process seemed to start from within CCS but failed.

I followed the instructions in /ccs_base/common/uscif/xds110 , updated the firmware and set a serial number.

The debugger now seems to be recognised:

Tims-Mac:xds110 tim$ ./xdsdfu -m

USB Device Firmware Upgrade Utility

Copyright (c) 2008-2015 Texas Instruments Incorporated.  All rights reserved.

Scanning USB buses for supported XDS110 devices...

<<<< Device 0 >>>>

VID: 0x0451    PID: 0xbef3

Device Name:   XDS110 Embed with CMSIS-DAP

Version:       2.3.0.11

Manufacturer:  Texas Instruments

Serial Num:    00000001

Mode:          Runtime

However, when I attempt to start the debugger in CCS, I still see an error:

Error connecting to the target:

(Error -260 @ 0x0)

An attempt to connect to the XDS110 failed.

The cause may be one or more of: no XDS110 is connected, invalid

firmware update, invalid XDS110 serial number, or faulty USB

cable. The firmware and serial number may be updated using the

xdsdfu utility found in the .../ccs_base/common/uscif/xds110

directory of your installation. View the ReadMe.txt file there

for instructions.

 

I can't see any matches googling error -260

I'm using CCs 7.4.0 on OSX 10.12.6

  • sometime I see a different error:

    Error connecting to the target:
    (Error -1170 @ 0x0)
    Unable to access the DAP. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
    (Emulation package 7.0.100.0)

    I don't get any matches searching -1170 either

    digging around in the target configuration I see 'TEST CONNECTION' :





    [Start: Texas Instruments XDS110 USB Debug Probe]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    /Users/tim/.ti/ti/3/0/BrdDat/testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'libjioxds110.dylib'.
    The library build date was 'Nov 6 2017'.
    The library build time was '10:21:57'.
    The library package version is '7.0.100.0'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '5' (0x00000005).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the XDS110 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for XDS110 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.

    The JTAG IR Integrity scan-test has succeeded.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.

    The JTAG DR Integrity scan-test has succeeded.

    [End: Texas Instruments XDS110 USB Debug Probe]
  • Hi,

    For error -1170 please see e2e.ti.com/.../2131099

    Jan
  • I see the post says "Please use Uniflash software and switch device to development mode." : is this documented anywhere? I'm looking at Uniflash but it's not obvious how to do that
  • That worked, thanks.

    It might be an idea to mention this in "Quick Start Guide" ?