Patrick,
Check out TIDA-00302. It's a TI Design about transient robustness for current shunt monitors , but many of the principles still apply. Depending on how the EOS event is happening - like if the supply voltage has a transient that exceeds the…
Hi Dave,
You may be right about large input tranisient causing this permanent damage. You can try the suggestions in 8.4.5 section in the datasheet for improving transient robustness. INA214B devices are certainly less sensitive to these tranisients…
Hello,
Thanks for posting your questions.
1. The ADC is 12-bit so yes measurement resolution will meet 12-bit.
2. Maximum error is dependent upon the shunt resistor and the device gain you choose. So for example lets say you choose a 1-Ω shunt and…
Per-Åke,
Mayrim and I looked over your schematics and and discussed this a bit. If I'm not mistaken, you've got a 3-phase H-bridge driver circuit and you're monitoring each phase with a high-side shunt. Is that correct? I'll assume it is and move on…
Hello Eason, I believe you may be experiencing transient spikes on your supply voltage and/or common voltage pins. Please obtain oscilloscope screenshots measuring your supply voltage and common voltage on power-up with your setup. If you are experiencing…
Should you include TVS protection diodes in your circuit?
Example INA250 schematic with TVS protection diodes
In the above simplified circuit diagram, TVS diode (tranzorbers) are incorporated to the input pins of the INA250 , as…
Courtland, So you see VOUT = 0.7V and VIN = 3.1mV with no load. Once you connect phone, does VOUT become a correct value? Or can it become 2V to 3V and thus this does not represent actual current? These seem like separate problems. If you can measure…
Ben,
The difference between Version A and Versions B and C are the internal ESD protection diodes and their structure. The internal component of the Version A device that will latch up during a high-voltage transient is not present in the B and C versions…