• State
  • Locked Locked
  • Replies 2 replies
  • Subscribers 48 subscribers
  • Views 263 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

OPA2170: ESD Question

James Hsieh
Prodigy 530 points
Part Number: OPA2170

Hello,

Due the OPA2170 from customer's circuit is damaged by ESD, causing pin6 short to GND. Customer want to reproduce this failure.

Is there any actual experimental methods to test their circuit? e.g. function generator apply certain level spike on test point.

Thank you.

BR,

James

  • 0
    Guru 140200 points

    Hi James,

    ESD is a high voltage issue and cannot be simply tested with a standard function generator. But you could eventually rent an ESD-gun?

    Do you need any support on strengthening the OPA2170 against ESD?

    Kai

  • 0 in reply to kai klaas69
    TI__Mastermind 27360 points

    Hi James,

    Kai is right. The standard function generator would likely not work. The ESD ratings for OPA2170 are based on how it's defined in the Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 and Charged-device model (CDM), per JEDEC specification JESD22-C101.

    These JEDEC specs should specify how to test our device. However for a circuit that's a bit more complicated as there might be many other devices in the system which add new variables. That's why JEDEC tends to focus on device specific testing.

    I want to better understand why the customer wants to recreate this failure, if they already know it was caused by ESD? 

    Best Regards, 

    Robert Clifton