Hi, I have a use for the ACF2101 switched integrator that does not fit the datasheet usage. Instead of integrating photodiode current I am measuring charge from excess charged particles hitting a halo ring. It's part of the beam diagnostics system for a particle accelerator.
From what I've seen, there is no characterization of the input voltage noise or current noise of the internal amplifier, only typical noise gain analysis in the various states of the integrator.
Also, I'm surprised that the switch noise is listed as uncorrelated, there must be also a correlated component from charge injection, corresponding to sampling frequency?