Hi guys,
I've simulated with OPA4322 negative feedback amplifier.
Simulation is observed clamping at 100 mV, while in reality measurement such clamping does not occur.(minimum is GND)
does anybody occur this? or what might this problem be?
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Hi guys,
I've simulated with OPA4322 negative feedback amplifier.
Simulation is observed clamping at 100 mV, while in reality measurement such clamping does not occur.(minimum is GND)
does anybody occur this? or what might this problem be?
Merak,
thanks for your explanation.
1. So you meant that I could try with the input Vin, which would result in clamping, longer to see if such clamping did occur.
2. what do mean by monitoring the Vos in measurement?
is my understanding right?
yao
Thank you very much Marek, this help me clarify a lot.
but for another thing. is it possible to provide a model to simulate the dynamical behavior to fit with the measurement(vout could reach 10 mV)?
i know sometimes the datasheet would set in the stringer requirements in case of the worse performance.
thank you,
yao
Yao,
In order to make the model match the non-linear performance of the output stage, this would require using actual transistors for macro-modeling that makes the circuit much more complex and leads to convergence problems in simulations. Since our modern macro-models are purely behavioural (no single transistor inside) they cannot match the non-linear op amp performance.
Also, since the process variation results in changes in the behaviour of the circuit especially in non-linear regions of operation, using such macro-models would lead to unpleasent surprises in actual performance of the circuit. For that reason the models match only the linear performance of the IC (e.g. Vout condition in AOL).