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LM139AQML-SP: SEE tolerance

Mihir Gupta65
Intellectual 2165 points

Part Number: LM139AQML-SP

Hi Team,

I have a customer who is asking the following question about the SEE Tolerance for the LM139AQML-SP. Here's their question:

I am trying to find out the LET of the device with regard to SEL. By reviewing the attached report (  )I have seen the following:

No evidence of (SEL) or any other destructive single event effects was seen during any of the testing

In the Report, a LET of 40,6 MeV-cm2/mg is mentioned, therefore I could at least take this value as threshold. Nevertheless, I assume that the real threshold is much higher. I have seen that we have considered 70 MeV-cm2/mg in the frame of other project but honestly I do not know where the data came from.

Could you support us a little bit with this topic?

Regards

Mihir

  • 0
    TI__Genius 17125 points

    Hello Mihir,

    The LM139AQML-SP is a bipolar product and SEL would be unexpected, which is why SEL testing was not performed.  Also, this product does not have any oxides where destructive tests such as SEGR or SEDR could occur.

    At the end of the paper there are references to many other articles and websites with additional SEE testing, at much higher energies.  Although most of those were from belore the die shrink, they would be applicable for SEL and SEDR as the die shrink just tightened the alignment and critical dimension tolerances due to the improvement in wafer fab equipment.