ADC3444: Test Pattern Output Discrepancies in 2-Wire Mode

Part Number: ADC3444

Hi,

Below is ADC3444 operational behavior, specifically concerning the test pattern mode when configured for 25Msps and 2-wire mode.

 ADC3444 2-Wire LVDS output test.docx 

• Configuration: ADC3444 configured to 25Msps and 2-wire mode. Test pattern mode was activated for Channel C to verify the output functionality.
• Observation 1 (DC0): When applying "All 0" and "All 1" patterns to DC0 (Lower 7 bits, D0 to D6), the output waveforms measured via an oscilloscope were confirmed to be normal.
• Observation 2 (DC1): However, when applying "All 0" and "All 1" patterns to DC1 (Upper 7 bits, D7 to D13), the resulting waveforms differed significantly from those observed on DC0.

• Please review the attached waveform data and provide an analysis of the discrepancy.
• Please clarify the expected, correct waveform output behavior when the test pattern mode is activated under these specific configuration settings (25Msps, 2-wire mode, Channel C).